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  Distribution: Wafer Test

 


 
Wafer Test: AMST Vertical Probe Card
 
Show applicability of simple Micro-cantilever probe for Semiconductor testing
Great design freedom of the cantilever(position, length, width, thickness); No plastic deformation
Single Crystal Silicon Cantilever
Semiconductor fabrication process
High resilience
Fine pitch possible
Repairable by replacement of defective block
Large Area Probing Possible

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